发明名称 FILM FORMING METHOD, FILM FORMING APPARATUS, AND STORAGE MEDIUM
摘要 The present invention provides a technique capable of performing epitaxial growth of an AlN film without any concern about cracking and having high quality crystals on a substrate having at least a surface part made of single crystal silicon. According to the present invention, the method includes a process of performing, one or more times, a cycle comprising: a first step of supplying a raw material gas including Al compounds on a Si substrate in vacuum atmosphere; and a second step of continuously supplying NH_4 gas to react the NH_4 gas with the AlN compounds adsorbed on the Si substrate to form a seed layer made of AlN, and a process of supplying a raw material gas including Al compounds, and NH_4 gas at the same time to form an AlN film on the seed layer. Since the seed layer is formed as a dense AlN film, cracks are prevented from occurring in the AlN film formed on the seed layer.
申请公布号 KR20160110114(A) 申请公布日期 2016.09.21
申请号 KR20160024997 申请日期 2016.03.02
申请人 TOKYO ELECTRON LIMITED 发明人 UMEZAWA KOTA;WATANABE YOSUKE
分类号 H01L21/28;H01L21/02;H01L21/205;H01L21/67 主分类号 H01L21/28
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