发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of reducing the capacity between a gate and a drain.SOLUTION: A semiconductor device comprises: a channel layer 14; an electron supply layer 15 disposed on the channel layer 14; a gate electrode 19 disposed on the electron supply layer 15; a source electrode 17 and a drain electrode 18 disposed on the electron supply layer 15, sandwiching the gate electrode 19 therebetween; and a support layer 13 disposed below the channel layer 14 to support the channel layer 14 and including a cavity 20 located deflected to the drain electrode 18 side with respect to the gate electrode 19.
申请公布号 JP5991201(B2) 申请公布日期 2016.09.14
申请号 JP20130000498 申请日期 2013.01.07
申请人 富士通株式会社 发明人 高橋 剛
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
代理机构 代理人
主权项
地址