发明名称 シリコンウェーハの熱処理方法
摘要 A silicon wafer heat treatment method includes: placing a silicon wafer on a SiC jig and into a heat treatment furnace; performing heat treatment on the silicon wafer in the heat treatment furnace in a first non-oxidizing atmosphere; reducing the temperature; and carrying the silicon wafer out of the heat treatment furnace. In the heat reduction step, after the temperature is reduced to the temperature at which the silicon wafer can be carried out of the heat treatment furnace, the first non-oxidizing atmosphere is switched to an atmosphere containing oxygen, an oxide film having a thickness of 1 to 10 nm is formed on the surface of the SiC jig in the atmosphere containing oxygen, and the atmosphere containing oxygen is then switched to a second non-oxidizing atmosphere. A silicon wafer heat treatment method can prevent carbon contamination from a jig and an environment during a heat treatment process.
申请公布号 JP5991284(B2) 申请公布日期 2016.09.14
申请号 JP20130173248 申请日期 2013.08.23
申请人 信越半導体株式会社 发明人 曲 偉峰;田原 史夫
分类号 H01L21/324;C30B29/06;C30B33/02;H01L21/683 主分类号 H01L21/324
代理机构 代理人
主权项
地址