发明名称 METHOD OF DEPOSITING ELECTROPOSITIVE METAL CONTAINING LAYERS FOR SEMICONDUCTOR APPLICATIONS
摘要 Embodiments of the present invention provide methods for forming layers that comprise electropositive metals through ALD (atomic layer deposition) and or CVD (chemical vapor deposition) processes, layers comprising one or more electropositive metals, and semiconductor devices comprising layers comprising one or more electropositive metals. In embodiments of the invention, the layers are thin or ultrathin (films that are less than 100 Å thick) and or conformal films. Additionally provided are transistor devices, metal interconnects, and computing devices comprising metal layers comprising one or more electropositive metals.
申请公布号 EP2761663(B1) 申请公布日期 2016.09.14
申请号 EP20110873468 申请日期 2011.09.29
申请人 INTEL CORPORATION 发明人 ROMERO, PATRICIO E.;CLENDENNING, SCOTT B.
分类号 H01L21/285;C23C16/30;C23C16/42;H01L21/3205;H01L21/336;H01L21/768;H01L29/06;H01L29/49;H01L29/51;H01L29/66;H01L29/775;H01L29/78;H01L29/786 主分类号 H01L21/285
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