发明名称 |
QUANTITATIVE X-RAY ANALYSIS |
摘要 |
Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluoresence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector. |
申请公布号 |
EP3064933(A1) |
申请公布日期 |
2016.09.07 |
申请号 |
EP20160158318 |
申请日期 |
2016.03.02 |
申请人 |
PANALYTICAL B.V. |
发明人 |
HEGEMAN, PETRONELLA EMERENTIANA;BRONS, GUSTAAF CHRISTIAN;KOMELKOV, ALEKSANDR;VREBOS, BRUNO A. R.;ZARKADAS, CHARALAMPOS |
分类号 |
G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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