| 摘要 |
An organic light-emitting diode manufactured from an organic light-emitting diode substrate in which a concave-convex structure is provided in at least a part of the surface, in which the concave-convex structure is capable of obtaining an atomic force microscope (AFM) image in which a plurality of dots is dispersed when observed by an AFM. A histogram is created by measuring a diameter (nm) of each of the plurality of dots present in a randomly selected region having an area of 25 μm2 on the atomic force microscope image, resulting in a plurality of peaks including one main peak and one or more sub-peaks, and the chromaticity of light emitted from the organic light-emitting diode is in a range of (x, y)=(0.28 to 0.50, 0.29 to 0.45) in a CIE standard colorimetric system. |
