| 摘要 |
A test device (10), for performing a series of tests on a device under test (DUT), comprising a memory (12) storing configuration data defining parameters for at least one list of receive tests; an RF signal generator (18); an RF signal analyser (20); and a test sequencer (14) for executing the tests. The test sequencer configuring the test device into a first mode for execution of each list of receive tests, whereby, in the first mode, for each test: the RF signal analyser is arranged to receive a command signal from the DUT, the test sequencer is arranged to retrieve from the memory configuration data for the next test to be executed based on the command signal and to configure the RF signal generator using the configuration data; the RF signal generator is arranged to transmit a test signal to the DUT according to the configuration data. Preferably the test device is further arranged to similarly perform a list of transmit tests in a second mode, whereby: the RF signal generator is arranged to transmit a command signal to the DUT; the RF signal analyser is arranged to receive a test signal from the DUT. The DUT may be a mobile communications device. |
