发明名称 SPM IMAGING APPARATUS, PROBE AND METHOD
摘要 An elongate probe (50) for use in probe microscopy comprises a module (51) provided between a probe tip (53) and a driver (52). In use the driver (52) applies oscillations to the module (51) which are transmitted by the module to the tip (53). With the probe tip (53) positioned close to the surface of a sample, any phase variance in the oscillation of the tip with respect to the driving oscillation is representative of an interaction between the tip and the sample surface. The elongate arrangement of the probe (50) is particularly beneficial when used to probe samples which require a liquid environment.
申请公布号 EP2250480(B1) 申请公布日期 2016.08.31
申请号 EP20090719209 申请日期 2009.03.12
申请人 ORBITAL INSTRUMENTS LIMITED 发明人 FINLAN, MARTIN F;WILKINS, SHELLEY
分类号 G01Q60/34;G01Q60/38;G01Q70/10;G01Q70/14 主分类号 G01Q60/34
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