发明名称 Shape measuring apparatus
摘要 A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
申请公布号 EP2017599(B1) 申请公布日期 2016.08.31
申请号 EP20080013022 申请日期 2008.07.18
申请人 MITUTOYO CORPORATION 发明人 KAWASAKI, KAZUHIKO;SUZUKI, YOSHIMASA;KOGA, SATOSHI
分类号 G01Q60/32;G01B5/20;G01B21/20;G01Q10/06;G01Q20/00;G01Q20/02 主分类号 G01Q60/32
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