| 摘要 |
An x-ray apparatus comprises an x-ray source and an x-ray detector. Between source and detector is a member perturbing characteristics of x-ray photons. Examples of this include translucent, rotating or moving lamellae, multi-absorption plates (MAP) with regions of different thickness, corrugated memory metal or piezoelectric control of collimator shape. A first database sores signal output values representative of material type and material thicknesses. A second database stores scatter kernels indicative of material type and/or material thicknesses. An algorithm compares the output signal of the x-ray detector with values in the first database to output a most likely material and/or thickness from the first database; selects from the second database the scatter kernels associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector. The algorithm may also add to the output the scatter signal as if it was direct radiation and iterate. |
