| 摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus that can reduce the number of possessions of probes and shorten a probe exchange time since a conventional magnetic flaw detection probe has probes with different kinds of sensor attachment angles by defect shape kinds and each time a defect shape changes, the magnetic flaw detection probe is exchanged into a suitable probe kind.SOLUTION: There is provided a magnetic flaw detection probe 6 in which a holder 3 holds one or more rectangular sensors 2. For the probe 6, sensor attachment angles of the rectangular sensors 2 with respect to the holder 3 are individually variable. |
