发明名称 TRANSISTORS, MEMORY CELLS AND SEMICONDUCTOR CONSTRUCTIONS
摘要 Some embodiments include a semiconductor construction having a gate extending into a semiconductor base. Conductively-doped source and drain regions are within the base adjacent the gate. A gate dielectric has a first segment between the source region and the gate, a second segment between the drain region and the gate, and a third segment between the first and second segments. At least a portion of the gate dielectric comprises ferroelectric material. In some embodiments the ferroelectric material is within each of the first, second and third segments. In some embodiments, the ferroelectric material is within the first segment or the third segment. In some embodiments, a transistor has a gate, a source region and a drain region; and has a channel region between the source and drain regions. The transistor has a gate dielectric which contains ferroelectric material between the source region and the gate.
申请公布号 EP2923378(A4) 申请公布日期 2016.08.24
申请号 EP20130856981 申请日期 2013.10.15
申请人 MICRON TECHNOLOGY, INC. 发明人 RAMASWAMY, NIRMAL;PRALL, KIRK, D.;KINNEY, WAYNE
分类号 H01L27/108;G11C14/00;H01L21/28;H01L27/115;H01L29/08;H01L29/423;H01L29/51;H01L29/66;H01L29/78 主分类号 H01L27/108
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