发明名称 回路基板検査装置および回路基板検査方法
摘要 PROBLEM TO BE SOLVED: To improve the inspection efficiency of continuity inspection of a circuit board on which a conductor pattern having a plurality of end points is formed.SOLUTION: An inspection unit is provided which measures a physical quantity between a pair of end points selected from a plurality of end points (Pa1 to Pa7) on a circuit board on which a conductor pattern P1 having the plurality of end points is formed, to execute continuity inspection of the conductor pattern P1 on the basis of the physical quantity. In the continuity inspection, the inspection unit repeatedly executes processing of selecting one arbitrary end point out of unselected end points in the conductor pattern P1 and another end point between which and the one end point the number of branch points (Pb1 to Pb4) in the conductor pattern P1 is largest, and of inspecting a continuity state between the pair of selected end points and, if only one end point is left unselected, inspecting a continuity inspection between the one end point and arbitrary one of selected end points and terminates continuity inspection in the case of the absence of end points left unselected.
申请公布号 JP5972763(B2) 申请公布日期 2016.08.17
申请号 JP20120255139 申请日期 2012.11.21
申请人 日置電機株式会社 发明人 清水 隆弘
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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