| 摘要 |
PROBLEM TO BE SOLVED: To provide a shape measurement apparatus and a shape measurement method capable of reducing measurement time.SOLUTION: The shape measurement apparatus includes: a projector 10 that projects, to a measurement target 50, plural phase shift patterns in which the brightness changes periodically and phases are displaced from each other and plural space code patterns which are binary patterns including bright portions and dark portions each having different periods; an imaging device 20 that take images of the measurement target 50; and calculation section that compares plural space code images of the measurement target 50 to which plural space code patterns are projected with a reference image generated from plural phase shift images of the measurement target 50 to which plural phase shift patterns are projected, and calculates the shape of the measurement target 50 using brightness and darkness information of plural space code images in which the brightness and darkness is determined in each of the pixels of plural space code images and phase information calculated from the plural phase shift images. |
