发明名称 APPARATUS AND METHOD FOR PREVENTING MARKING POSITION CHANGE OF WAFER IN WAFER MARKING PROCESS USING LASER, AND WAFER MARKING APPARATUS AND METHOD USING LASER
摘要 Disclosed are an apparatus and method for preventing marking position change of a wafer in a wafer marking process using laser, and a wafer marking apparatus and method using laser. The apparatus for preventing marking position change of a wafer comprises: a wafer holder including a holder insert portion on which the wafer is seated, and having a target pattern having a certain shape; a stage installed to be movable in first and second directions around the wafer holder; and a camera mounted on the stage to measure the location of the wafer and the location of the target pattern.
申请公布号 KR20160097053(A) 申请公布日期 2016.08.17
申请号 KR20150018882 申请日期 2015.02.06
申请人 EO TECHNICS CO., LTD. 发明人 KIM, SOO YOUNG;KIM, KYEONG TAE;MOON, JAE HO
分类号 H01L23/544;H01L21/66 主分类号 H01L23/544
代理机构 代理人
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