发明名称 |
APPARATUS AND METHOD FOR PREVENTING MARKING POSITION CHANGE OF WAFER IN WAFER MARKING PROCESS USING LASER, AND WAFER MARKING APPARATUS AND METHOD USING LASER |
摘要 |
Disclosed are an apparatus and method for preventing marking position change of a wafer in a wafer marking process using laser, and a wafer marking apparatus and method using laser. The apparatus for preventing marking position change of a wafer comprises: a wafer holder including a holder insert portion on which the wafer is seated, and having a target pattern having a certain shape; a stage installed to be movable in first and second directions around the wafer holder; and a camera mounted on the stage to measure the location of the wafer and the location of the target pattern. |
申请公布号 |
KR20160097053(A) |
申请公布日期 |
2016.08.17 |
申请号 |
KR20150018882 |
申请日期 |
2015.02.06 |
申请人 |
EO TECHNICS CO., LTD. |
发明人 |
KIM, SOO YOUNG;KIM, KYEONG TAE;MOON, JAE HO |
分类号 |
H01L23/544;H01L21/66 |
主分类号 |
H01L23/544 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|