发明名称 テスト設計支援装置及びプログラム
摘要 A test design assistance device 10 acquires information about the number of levels indicating the number of values which can be obtained for each factor in a plurality of factors of a test target, selects a matrix capable of allocating all of factors in a maximum number of levels information in the matrix capable of allocating factors in multilevel generated based on an orthogonal table, sets the maximum number of the number of levels in the levels of factors which are not allocated as a focused number of levels, and allocates factors in the focused number of levels to the matrix when the number of columns capable of allocating the factors in the focused number of levels is equal to greater than the number of factors in the focused number of levels, in the selected matrix.
申请公布号 JP5971159(B2) 申请公布日期 2016.08.17
申请号 JP20130051948 申请日期 2013.03.14
申请人 富士ゼロックス株式会社 发明人 秋山 浩一
分类号 G06F11/36 主分类号 G06F11/36
代理机构 代理人
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