发明名称 半導体装置および半導体装置の製造方法
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method of the same, which can improve electrical insulation properties.SOLUTION: A semiconductor device 100 comprises: a lead frame 2; a semiconductor element 1; an insulator 9; and pins 6. The lead frame 2 has one surface 2a and the other surface 2b, which are opposite to each other. The semiconductor element 1 is mounted on the one surface 2a of the lead frame 2. The insulator 9 covers the one surface 2a of the lead frame 2 and the semiconductor element 1, and includes holes 14 each of which reaches at least one component between the semiconductor element 1 and the lead frame 2. Each of the pins 6 is arranged in each hole of the insulator 9 and electrically insulated from the semiconductor element 1 and the lead frame 2 and includes a conductive part 8a.
申请公布号 JP5972158(B2) 申请公布日期 2016.08.17
申请号 JP20120258652 申请日期 2012.11.27
申请人 三菱電機株式会社 发明人 梶原 孝信
分类号 H01L21/56;H01L23/28;H01L23/34 主分类号 H01L21/56
代理机构 代理人
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