发明名称 半導体装置の製造方法
摘要 PROBLEM TO BE SOLVED: To manufacture a semiconductor device in simple processes.SOLUTION: A fifth interlayer insulation film 113e is disposed on an imaging region 103 and a peripheral region 104 of a semiconductor substrate 101. An opening 116 is formed at a position overlapping with a photoelectric conversion part 105 of the fifth interlayer insulation film 113e. A first waveguide member 118 is formed on the imaging region 103 and the peripheral region 104 of the semiconductor substrate 101. A part of the first waveguide member 118, disposed on the peripheral region 104, is removed to expose the fifth interlayer insulation film 113e.
申请公布号 JP5968481(B2) 申请公布日期 2016.08.10
申请号 JP20150042753 申请日期 2015.03.04
申请人 キヤノン株式会社 发明人 鈴木 健太郎;岡部 剛士;佐野 博晃;岩田 旬史
分类号 H01L27/14;H01L27/146;H04N5/369 主分类号 H01L27/14
代理机构 代理人
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