发明名称 Cu層形成方法及び半導体装置の製造方法
摘要 PROBLEM TO BE SOLVED: To provide a Cu film formation method which can tightly bury conductive materials of Cu inside fine recesses and which is optimal for obtaining wiring excellent in conductivity with high productivity.SOLUTION: A Cu layer formation method of an embodiment in which Cu is buried in recesses 16 formed on a surface of a workpiece 11, comprises: a first step of forming a Cu film 17 on a surface of the workpiece including inner surfaces of the recesses 16; and a second step of burying Cu in the recesses by flowing the Cu film due to a reflow process. In the middle of the second step, Cu atoms and Cu ions are supplied to the surface of the workpiece.
申请公布号 JP5965628(B2) 申请公布日期 2016.08.10
申请号 JP20110268331 申请日期 2011.12.07
申请人 株式会社アルバック 发明人 中村 真也;濱口 純一;武田 直樹;坂本 勇太;遠藤 洋平;小平 周司;岩澤 宏明;内田 洋平
分类号 H01L21/3205;C23C14/34;C23C14/58;H01L21/28;H01L21/285;H01L21/768;H01L23/532 主分类号 H01L21/3205
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