| 摘要 |
A contactor for a semiconductor device test according to one embodiment of the present invention is the contact that is physically touched in order to electrically connect an electrode of a test device and a contact ball of a semiconductor device. The contactor for a semiconductor device test comprises: a tip in contact with the contact ball of the semiconductor device; an upper portion which mounts the tip on the top and has a curved or polygonal structure protruding from the vertical line; and a lower portion which is connected to the upper portion in a downward direction, has a curved or polygonal structure protruding from the vertical line, and is symmetrical with the protruding upper portion. The contactor has an elastic feature by the structure where the upper portion and the lower portion are symmetrical, and by passing the force generated in the vertical direction to the Z axis direction, the elastic contact with the electrode of the test device and the contact ball of the semiconductor device is possible. |
