发明名称 |
METHOD AND SYSTEM FOR MEASUREMENT OF PARAMETERS OF A FLAT MATERIAL |
摘要 |
A system and method for measurement of parameters of a conductive material, include generating an oscillating electromagnetic field (EMF) interacting with a sample portion from a remotely positioned source; measuring values of components of impedance of the electromagnetic; populating a system of equations including a theory of electromagnetism- based mathematical model of the electromagnetic system; solving the system of equations to calculate values of a distance between the sample portion and the source, thickness of the sample portion in proximity to a point of projection of the source onto the sample portion and electromagnetic properties of the sample portion; outputting the calculated values as the measured values; and repeating the steps of generating, populating, solving, outputting and repeating using the calculated values for the step of populating in place of the measured component values. |
申请公布号 |
EP2443466(A4) |
申请公布日期 |
2016.07.20 |
申请号 |
EP20090846298 |
申请日期 |
2009.06.19 |
申请人 |
DOLPHIN MEASUREMENT SYSTEMS, LLC |
发明人 |
RAYKHMAN, ALEXANDER, M.;NAIDIS, EUGENE;WALDMAN, ELLIS, S. |
分类号 |
G01R29/08;G01B7/06;G01R27/02;G02B27/00 |
主分类号 |
G01R29/08 |
代理机构 |
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代理人 |
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地址 |
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