| 摘要 |
An automatic analysis device includes: a factor storage unit 12b which stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unit 103a which judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit 12a; and a factor judgment unit 103b which refers to the results of the judgment by the abnormality judgment unit 103a in a preset order, and would judge as an abnormality factor a factor stored in the factor storage unit 12b in association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal. The operator is informed of the abnormality factor on the basis of the result of the judgment by the factor judgment unit 103b. With this configuration, deterioration in the measurement accuracy can be reduced through the detection of an abnormality in the measurement result and the determination of the causative factor. |
