发明名称 RADIATION SOURCE, LITHOGRAPHIC APPARATUS, AND DEVICE MANUFACTURING METHOD
摘要 A spectral purity filter is configured to transmit extreme ultraviolet (EUV) radiation and deflect or absorb non-EUV secondary radiation. In an embodiment, the spectral purity filter includes a body of material highly transmissive of EUV radiation and a layer of material highly reflective of non-EUV secondary radiation located on a radiation incident side of the body. In an embodiment, the spectral purity filter includes a body of material highly transmissive of EUV radiation and a layer of high emissivity material on an end of the body.
申请公布号 EP2310912(B1) 申请公布日期 2016.07.13
申请号 EP20090777515 申请日期 2009.07.29
申请人 ASML NETHERLANDS BV 发明人 YAKUNIN, ANDREY, MIKHAILOVICH;BANINE, VADIM, YEVGENYEVICH;MOORS, JOHANNES, HUBERTUS, JOSEPHINA;SJAMENOK, LEONID, AIZIKOVITCH
分类号 G03F7/20;B82Y10/00;G02B5/20;G21K1/06;G21K1/10 主分类号 G03F7/20
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