发明名称 SCANNING MICROSCOPE WITH POLARISED SAMPLE ILLUMINATION
摘要 The invention relates to a method for investigating a sample, the sample being impinged upon by illuminating light, and detected light emerging from the sample being directed to a detector, and the illuminating light being directed through an acousto-optic component with which the impingement upon the sample by illuminating light can be temporarily interrupted. The method is notable for the fact that the sample is illuminated with a first illuminating light bundle that has a first linear polarization direction, and with a second illuminating light bundle whose linear polarization direction is continuously switched over between the first linear polarization direction and a second linear polarization direction different from the first linear polarization direction, the illuminating light having the first linear polarization direction proceeding along a first light path and illuminating light having the second linear polarization direction proceeding along a second light path, and the acousto-optic component combining the light paths.
申请公布号 EP3042239(A1) 申请公布日期 2016.07.13
申请号 EP20140758923 申请日期 2014.09.03
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 KRISHNAMACHARI, VISHNU VARDHAN
分类号 G02B27/28;G02B21/00 主分类号 G02B27/28
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