SPECTRAL-DOMAIN INTERFEROMETRIC METHOD AND SYSTEM FOR CHARACTERIZING TERAHERTZ RADIATION

摘要

A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898&pgr; can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (&pgr;/2).