发明名称 半導体装置の製造方法、クリーニング方法及び基板処理装置
摘要 PROBLEM TO BE SOLVED: To remove deposits in a processing chamber so as not to leave a residual film.SOLUTION: A manufacturing method of a semiconductor device includes: a substrate carry-in process where a substrate holder holding a substrate and a heat insulation body is carried in a processing chamber; a film formation process where a material gas is supplied to the processing chamber to form a film on the substrate; a substrate carry-out process where the substrate holder holding the substrate, which has been subject to the processing, is carried out from the processing chamber; a first cleaning process where a cleaning gas is supplied to the processing chamber while a substrate housing region in the processing chamber is heated at a first temperature and a heat insulation body housing region in the processing chamber is heated at a second temperature higher than the first temperature in a state that the substrate is not placed in the processing chamber; and a second cleaning process where the cleaning gas is supplied to the processing chamber while the heat insulation body housing region is heated at a third temperature and the substrate housing region is heated at a fourth temperature lower than the third temperature in the state that the substrate is not placed in the processing chamber.
申请公布号 JP5946643(B2) 申请公布日期 2016.07.06
申请号 JP20120004978 申请日期 2012.01.13
申请人 株式会社日立国際電気 发明人 奥田 和幸
分类号 H01L21/31;C23C16/44 主分类号 H01L21/31
代理机构 代理人
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