发明名称 基板外観検査機および生産ラインおよび基板外観検査方法
摘要 PROBLEM TO BE SOLVED: To provide a substrate appearance inspection device which easily secures insulation quality between a given component attached to the substrate and a solder part disposed around the component, and to provide a production line and a substrate appearance inspection method.SOLUTION: A substrate appearance inspection device 2 of this invention inspects a distance L1, L2 between a component 84a, 84b, 84c, 84d attached to a substrate 8 and a solder part 82a, 82b, 82c, 82d disposed around the component 84a, 84b, 84c, 84d on the substrate 8.
申请公布号 JP5947055(B2) 申请公布日期 2016.07.06
申请号 JP20120037343 申请日期 2012.02.23
申请人 富士機械製造株式会社 发明人 天野 雅史;大池 博史
分类号 H05K3/34;H05K13/04 主分类号 H05K3/34
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