| 摘要 |
Provided is a new connection conversion system replacing a connection conversion system of an inspection device and an inspection electrode terminal, which are used for the existing chip electronic component inspecting/screening device. According to the present invention, a metal oxide semiconductor field effect transistor (MOSFET), accommodated in a case, is used as a means of a relay switch of the connection conversion system of the inspection device and the inspection electrode terminal, composed of an operation electrode terminal and a fixed electrode terminal of a chip electronic component inspecting/screening device. The case, accommodating the MOSFET, is arranged to be adjacent to each of the operation electrode terminal and the fixed electrode terminal for inspection. By interposing a connector, the MOSFET is configured to be connected to the fixed electrode terminal and the operation electrode terminal. According to the present invention, by using the MOSFET, mercury is not used, high-speed connection conversion may be possible, and a product life span is enhanced. |
