发明名称 粒子吸着プローブ
摘要 Provided is a novel particle adsorption probe (1000) for picking up a particle by adsorbing the particle. The particle adsorption probe (1000) can selectively pick up a particle having a specific particle diameter from a group of particles having a wide particle diameter distribution without requiring the application of a physical stress in picking up the particle and without contaminating a foreign matter surface in picking up the particle, and allows the particle to be analytically evaluated in an analysis apparatus directly after picking up the particle. The particle adsorption probe (1000) of the present invention includes a carbon nanotube aggregate (100) including a plurality of carbon nanotubes (10).
申请公布号 JP5948125(B2) 申请公布日期 2016.07.06
申请号 JP20120095414 申请日期 2012.04.19
申请人 日東電工株式会社 发明人 前野 洋平;豊川 晶子
分类号 B25J7/00;B82Y30/00;G01N1/02;G01N15/00 主分类号 B25J7/00
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