发明名称 TESTING STATION WITH UPGRADING FUNCTION
摘要 Disclosed is a testing device having an upgrade function. The testing device comprises an upgrade rotation panel and a device body. The upgrade rotation panel includes: a rotation panel; and an assembly set module comprising a test base connected to the rotation panel to fix the rotation panel. The device body provides an accommodation space to install the upgrade rotation panel therein so as to allow the test device to test a test object having the different number of ring-shaped test pins. The present invention provides the testing device having an upgrade function to appropriately improve the manufacturing efficiency and a product lifespan of the existing testing device.
申请公布号 KR20160079643(A) 申请公布日期 2016.07.06
申请号 KR20150164092 申请日期 2015.11.23
申请人 SYNC-TECH SYSTEM CORP. 发明人 LAI HUNG WEI;LEE TSUNG JUN
分类号 G01R31/28;G01R1/04;G01R1/073;G01R31/01 主分类号 G01R31/28
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