发明名称 DISPLAY CONTROL SYSTEM, SUBSTRATE PROCESSING SYSTEM, AND DISPLAY CONTROL METHOD
摘要 PROBLEM TO BE SOLVED: To provide a display control system, a substrate processing system, and a display control method that are capable of improving operability of a substrate processing apparatus.SOLUTION: A display control system 500 comprises: at least two of a control device 510 for controlling operation of a CMP device for processing a substrate, a collection device 520 for collecting data to be used by the CMP device, a detection device 530 for detecting a polishing end point of the substrate, and a measurement device 540 for measuring the substrate's thickness; and display control software 516 for controlling display of a plurality of images processed by at lest two devices. The display control software 516 collects a plurality of images and displays the plurality of collected images on a single display device 517 so as to be capable of replacing the images.SELECTED DRAWING: Figure 4
申请公布号 JP2016119378(A) 申请公布日期 2016.06.30
申请号 JP20140257796 申请日期 2014.12.19
申请人 EBARA CORP 发明人 SUGIYAMA MITSUNORI;OKAMURA HIROAKI
分类号 H01L21/02;B23Q17/00;B23Q17/20;B24B37/34;H01L21/304 主分类号 H01L21/02
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