| 摘要 |
PROBLEM TO BE SOLVED: To provide an interaction analyzer that can automate fixing of a measurement sample to a measurement substrate and allows a worker to freely control the amount of the measurement sample at the observation.SOLUTION: The interaction analyzer includes: a substrate; a liquid-sending mechanism for sending a measurement sample and a reaction reagent to the substrate; an observation mechanism for observing the measurement sample on the substrate; an analyzing mechanism for analyzing the amount of the measurement sample fixed on the substrate based on the observation result obtained by the observation mechanism; and a control mechanism for adjusting the amount of the measurement sample fixed on the substrate. The interaction analyzer fixes the measurement sample on a surface of the substrate, measures the amount of the measurement sample fixed on the substrate surface, and adjusts the amount of the measurement sample fixed to the substrate based on the measurement result.SELECTED DRAWING: Figure 1 |
