USE OF VARIABLE XIC WIDTHS OF TOF-MSMS DATA FOR DETERMINATION OF BACKGROUND INTERFERENCE IN SRM ASSAYS

摘要

PROBLEM TO BE SOLVED: To provide the use of variable XIC widths of TOF-MSMS data for determination of background interference in SRM assays.SOLUTION: Systems and methods identify a product ion that does not include an interference. A full product ion spectrum for a mass range of an analyte in a sample is received from a tandem mass spectrometer. A first set of one or more peak parameters is calculated for a product ion in the full product ion spectrum using a first XIC window width. A second set of one or more peak parameters is calculated for the product ion using a second XIC window width. The product ion is identified as not including an interference, if the first set of one or more peak parameters and the second set of one or more peak parameters are substantially the same. The product ion is further confirmed or determined to be from the analyte and not from a matrix of the sample by correlating the product to a precursor ion of the analyte.SELECTED DRAWING: Figure 3