DEVICE FOR ANALYZING A SAMPLE GAS COMPRISING AN ION SOURCE

摘要

A device for analyzing a sample gas comprises an ion source for generating primary ions, a reaction chamber to which the primary ions produced in the ion source and the sample gas to be analyzed can be supplied in order to form product ions by chemical ionization of components in the sample gas, and an analyzer/detector unit for determining different types of ions. A reaction space in the reaction chamber, within which the primary ions supplied to the reaction chamber and the product ions produced are guided and which extends between a first end facing the ion source and a second end facing the analyzer/detector unit, is surrounded by at least two electrodes which are in the form of helices which wind round a common axis with identical pitches and are offset with respect to one another in the direction of the axis. An AC voltage is applied to each of the electrodes.

主权项

1. A device for analyzing a sample gas comprising
an ion source for generating primary ions, a reaction chamber to which the primary ions generated in the ion source and the sample gas to be analyzed can be supplied for generating product ions by chemical ionization of components of the sample gas, and an analyzer/detector unit for determining different types of ions, characterized in that a reaction space of the reaction chamber in which the primary ions supplied to the reaction space and the generated product ions are guided and which extends between a first end facing the ion source and a second end facing the analyzer/detector unit is surrounded by at least two electrodes which are formed as helices winding together about a common axis and having equal pitches (g) and being offset with respect to one another in the direction of the axis and to each of which an AC voltage is applied.