| 摘要 |
According to one embodiment, a measurement device includes a first chamber, a second chamber, a partition provided between the first and second chambers, a through hole which is provided in the partition and with which the first chamber and the second chamber communicate each other, a first electrode provided in the first chamber, and a second electrode provided in the second chamber. The first electrode and the second electrode contain different metals or alloys at least in surface layers thereof, and a relationship of Ia<Ib is satisfied, where Ia is an ionization tendency of a metal or an alloy contained at least in the surface layer of the first electrode and Ib is an ionization tendency of a metal or an alloy contained at least in the surface layer of the second electrode. |
