| 摘要 |
The invention relates to a high-frequency test probe (S) for testing an electrical test object, comprising a contacting connector assembly (1) for establishing a releasable contact between the high-frequency test probe (S) and the electrical test object, a leading-away connector assembly (2) for connecting a measuring device to the high-frequency test probe (S), and a compensation network (3) designed to perform an impedance transformation, wherein the compensation network (3) comprises a circuit board (4), wherein the circuit board (4) is populated with a plurality of electrical components (5.1, 5.2, 5.3, 5.4) in such a way that the compensation network (3) is suitable for performing the impedance transformation, and the circuit board (4) is electrically and mechanically connected to the contacting connector assembly (1). |
