发明名称 DISC HOLDING APPARATUS AND DEFECT/FOREIGN MATERIAL DETECTING APPARATUS
摘要 A disc holding apparatus including a plurality of movable holding claws, which have a holding section abutting to the outer circumference of a wafer having a notch and are arranged in the circumference direction of the wafer. The wafer is held by having each holding section on the inner edge side of each movable holding claw abut to the outer circumference of the wafer, thereby, at the time of detecting the notch by a sensor including a light source and a light receiving section, even when one of the holding sections abuts to the outer circumference of the wafer at a part where the notch exists, light from the light source is permitted to enter the light receiving section through the notch without being blocked by the holding section. Even when the wafer is held at the part where the notch exists, the wafer is not required to be correctly held again and throughput is improved with a shortened process time.
申请公布号 EP2095412(B1) 申请公布日期 2016.06.29
申请号 EP20070850547 申请日期 2007.12.13
申请人 KEMET JAPAN CO., LTD. 发明人 MUNAKATA, TERUYOSHI
分类号 H01L21/68;C07C37/20;C07C37/84;H01L21/683 主分类号 H01L21/68
代理机构 代理人
主权项
地址