发明名称 |
WAFER STRUCTURE AND METHOD FOR WAFER DICING |
摘要 |
A semiconductor die comprises a main body, protrusion portions, and bonding pads. The main body includes a sidewall. The protrusion portions horizontally protrude from the sidewall respectively. The bonding pads are arranged on the protrusion portions respectively. A wafer dicing method comprises the following steps. Chips are formed on a semiconductor wafer. The bonding pads are formed on boundary lines between every two adjacent chips. A scribe line is formed and arranged along the bonding pads. A photolithographic pattern is formed on an upper surface of the semiconductor wafer to expose the scribe line. The scribe line is substantially etched up to a depth inside the semiconductor wafer under the upper surface to form an etched pattern. A rear surface of the semiconductor wafer thins until the etched pattern of the wafer substrate is exposed. |
申请公布号 |
KR20160075317(A) |
申请公布日期 |
2016.06.29 |
申请号 |
KR20150166542 |
申请日期 |
2015.11.26 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LEE YUEH CHUAN;CHEN CHIA CHAN |
分类号 |
H01L21/78;H01L21/302;H01L21/56;H01L21/76;H01L23/00 |
主分类号 |
H01L21/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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