发明名称 WAFER STRUCTURE AND METHOD FOR WAFER DICING
摘要 A semiconductor die comprises a main body, protrusion portions, and bonding pads. The main body includes a sidewall. The protrusion portions horizontally protrude from the sidewall respectively. The bonding pads are arranged on the protrusion portions respectively. A wafer dicing method comprises the following steps. Chips are formed on a semiconductor wafer. The bonding pads are formed on boundary lines between every two adjacent chips. A scribe line is formed and arranged along the bonding pads. A photolithographic pattern is formed on an upper surface of the semiconductor wafer to expose the scribe line. The scribe line is substantially etched up to a depth inside the semiconductor wafer under the upper surface to form an etched pattern. A rear surface of the semiconductor wafer thins until the etched pattern of the wafer substrate is exposed.
申请公布号 KR20160075317(A) 申请公布日期 2016.06.29
申请号 KR20150166542 申请日期 2015.11.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LEE YUEH CHUAN;CHEN CHIA CHAN
分类号 H01L21/78;H01L21/302;H01L21/56;H01L21/76;H01L23/00 主分类号 H01L21/78
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