发明名称 DEPOSITION SOURCES FOR IMPROVING UNIFORMITY OF DEPOSITION THIN FILM
摘要 The present invention relates to a deposition source for improving the uniformity of a deposition thin film comprising: a first evaporation source which injects deposition materials in a linear way; a second evaporation source which is arranged in parallel with the first evaporation source, and injects deposition materials different from the deposition materials injected from the first evaporation source; a first evaporation source nozzle unit containing a plurality of first evaporation source nozzles formed on the first evaporation source in a radial direction; a second evaporation source nozzle unit containing a plurality of second evaporation source nozzles formed on the second evaporation source. The second evaporation source nozzles are extended to be near locations of the first evaporation source nozzles. A discharging end portion of the second evaporation source nozzles is formed to form a parallel angle with the first evaporation source nozzles, such that a deposition thin film is more uniformly formed. Therefore, the deposition source improves the quality of elements and increases the yield rate.
申请公布号 KR20160074858(A) 申请公布日期 2016.06.29
申请号 KR20140183488 申请日期 2014.12.18
申请人 SUNIC SYSTEM. LTD. 发明人 PARK, HYUN SIK;KIM, KIL WON
分类号 H01L51/56;H01L21/203 主分类号 H01L51/56
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