发明名称 半導体装置の製造方法
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method capable of improving productivity by achieving reduction in processing time.SOLUTION: A semiconductor device manufacturing method comprises: emitting laser beams L by a laser beam irradiation device 30 from one surface 10a side of a semiconductor substrate 10 by setting a light focusing point P at inside the semiconductor substrate 10 to form a modified region K; subsequently removing a region from the one surface 10a side to the modified region K and the modified region K by etching to form a trench 20 such that a width of an opening 20a of the trench 20 formed on the one surface 10a side becomes narrower than a width of an internal region formed by removing the modified region K.
申请公布号 JP5942828(B2) 申请公布日期 2016.06.29
申请号 JP20120268653 申请日期 2012.12.07
申请人 株式会社デンソー 发明人 富坂 学;多屋 淳志;内田 智也;佐野 幸浩
分类号 H01L21/3065;B23K26/00;B23K26/364;H01L21/306;H01L21/308 主分类号 H01L21/3065
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