发明名称 |
RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition which makes it possible to prepare a resist pattern with excellent line edge roughness.SOLUTION: The present invention provides a resist composition comprising a resin (A1) having an acid-labile group, a resin (A2) having a structural unit represented by formula (I) and an acid generator [where Ris a C1-C13 fluorinated saturated hydrocarbon group. Ais a single bond, a C1-C6 alkanediyl group or-A-X-(A-X)-(A)-. * is a bond to an oxygen atom].SELECTED DRAWING: None |
申请公布号 |
JP2016114944(A) |
申请公布日期 |
2016.06.23 |
申请号 |
JP20150241267 |
申请日期 |
2015.12.10 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
MASUYAMA TATSURO;FUJITA SHINGO;ICHIKAWA KOJI |
分类号 |
G03F7/038;C08F22/18;G03F7/004;G03F7/039;G03F7/20 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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