发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
The semiconductor device includes: a substrate, an n-type drift region formed on a main surface of the substrate; a p-type well region, an n-type drain region and an n-type source region each formed in the drift region to extend from a second main surface of the drift region opposite to the first main surface of the drift region in contact with the substrate in a direction perpendicular to the second main surface; a gate groove extending from the second main surface in the perpendicular direction and penetrating the source region and the well region in a direction parallel to the first main surface of the substrate; and a gate electrode formed on a surface of the gate groove with a gate insulating film interposed therebetween, wherein the drift region has a higher impurity concentration than the substrate, and the well region extends to the inside of the substrate. |
申请公布号 |
US2016181371(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201414905648 |
申请日期 |
2014.06.03 |
申请人 |
NISSAN MOTOR CO., LTD. |
发明人 |
NI Wei;HAYASHI Tetsuya;MARUI Toshiharu;SAITO Yuji;EMORI Kenta |
分类号 |
H01L29/10;H01L29/66;H01L21/04;H01L29/08;H01L21/306;H01L21/265;H01L29/78;H01L29/16 |
主分类号 |
H01L29/10 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a substrate; a first conductivity type drift region formed on a first main surface of the substrate, formed of a same material as the substrate and having a higher impurity concentration than the substrate; a second conductivity type well region formed in the drift region to extend from a second main surface of the drift region opposite to a first main surface of the drift region in contact with the substrate in a direction perpendicular to the second main surface and including an edge extending to an inside of the substrate; a first conductivity type drain region formed in the drift region to be separated from the well region and extend from the second main surface in the perpendicular direction; a first conductivity type source region formed in the well region to extend from the second main surface in the perpendicular direction; a gate groove extending from the second main surface in the perpendicular direction and penetrating the source region and the well region in a direction parallel to the second main surface; a gate electrode formed on a surface of the gate groove with a gate insulating film interposed therebetween; a source electrode electrically connected to the source region and the well region; and a drain electrode electrically connected to the drain region. |
地址 |
Kanagawa JP |