| 摘要 |
The invention relates to a method and a device for determining at least one dimension of at least one object. In a first step of the method according to the invention, at least one pattern consisting of at least two pattern components is projected onto the at least one object using a stationary pattern projector; in a second step, at least one distance measurement of the distance between the pattern projector and the at least one object is carried out; in a third step, a sequence of at least two spatially resolved individual images of the at least one object, said individual images being composed of multiple pixels, is captured from different respective image-capturing perspectives using at least one image-capturing device while the pattern is being projected; in a fourth step, a group of pattern components which correspond to one another is identified in the individual images of the sequence; and in a fifth step, the measured distance is used to automatically calculate scaled positional information, in particular three-dimensional positional information, for the pattern component group identified in the fourth step in order to calculate the at least one dimension of the at least one object. The device according to the invention comprises at least one pattern projector, a distance measuring device, an image-capturing device, and an image-processing device. |
