发明名称 半導体装置
摘要 An object is to provide a thin film transistor including an oxide semiconductor layer, in which a material used for the oxide semiconductor layer and a material used for source and drain electrode layers are prevented from reacting with each other. The source and drain electrode layers provided over a substrate having an insulating surface have a stacked structure of two or more layers. In the stack of layers, a layer which is in contact with an oxide semiconductor layer is a metal layer including a metal element other than a metal element included in the oxide semiconductor layer. An element selected from Sn, Sb, Se, Te, Pd, Ag, Ni, and Cu; an alloy containing any of these elements as a component; an alloy containing any of these elements in combination; or the like is used for a material of the metal layer used.
申请公布号 JP5936739(B2) 申请公布日期 2016.06.22
申请号 JP20150078945 申请日期 2015.04.08
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平
分类号 H01L29/786;H01L21/28;H01L21/477;H01L29/417 主分类号 H01L29/786
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