Interferometric system and method of measuring of refraction index spatial distribution

摘要

The invented method of measuring of refraction index spatial distribution, according to the present invention, is suitable for use in digital holographic microscopy to observe samples in both reflected and pass-through radiations and as well to observe luminescence samples. The interferometric system comprises a first branch (9.1) and a second branch (9.2) with a plurality of optical elements. The first branch (9.1) comprises a diffraction grating (7) situated in a plane optically associated with an object plane (8.1) for making an achromatic hologram with a spatial carrier in an output image plane (8.2).