发明名称 IMAGE TYPE ELECTRON SPIN POLARIMETER
摘要 Provided is an image type electron spin polarimeter. It at least comprises a scattering target, a two-dimensional electron detector and an electron bending unit, wherein the electron bending unit is used for bending the orbit of the incident (scattered) electrons to a first (second) angle to arrive the scattering target (two-dimensional electron detector) with an optimal incident angle, and to transfer the image of the electron intensities from the entrance plane (scattering target) to the scattering target (two-dimensional electron detector) with small aberrations, and to separate the orbits of incident and scattered electrons to increase the degree of freedom of the geometric configuration of each component of the spin polarimeter. At least one of the first and second angles is not 0°, thereby achieving the first transfer of the two-dimensional image of electron intensities on the entrance plane to the scattering target and the second transfer from scattering target to the two-dimensional electron detector respectively with small aberrations, and then achieving multichannel measurements of the electron spin.
申请公布号 US2016172157(A1) 申请公布日期 2016.06.16
申请号 US201314906254 申请日期 2013.09.10
申请人 SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES 发明人 QIAO SHAN;WAN WEISHI;JI FUHAO
分类号 H01J37/29;H01J37/147;H01J37/244 主分类号 H01J37/29
代理机构 代理人
主权项 1. An image type electron spin polarimeter, characterized by comprising: a scattering target, a two-dimensional electron detector and an electron bending unit; wherein, the electron bending unit is used for bending the orbit of the incident (scattered) electrons to a first (second) angle, which enables the electrons to arrive at the scattering target (two dimensional electron detector) at an optimal incident angle and to transfer the electron intensity image from the entrance plane (scattering target) to the scattering target (two dimensional electron detector). The bending unit also separates the orbits of the incident and scattered electrons, and at least one of the bending angles is not 0°.
地址 Shanghai CN