发明名称 MEMORY DEVICE, METHOD OF GENERATING LOG OF COMMAND SIGNALS/ADDRESS SIGNALS OF MEMORY DEVICE, AND METHOD OF ANALYZING ERRORS OF MEMORY DEVICE
摘要 A memory device includes first and second memory cell arrays, a first controller, and a second controller. The first controller controls the first memory cell array through first word line signals and first bit line signals to execute an operation corresponding to a command signal based on an address signal and a data signal. The second controller includes first and second mode registers. The second controller writes sampled values of the address signal and the command signal to the second memory cell array through access signals to form a log in response to stored values of the first and second mode registers or reads stored values of the second memory cell array as the data signal through the access signals.
申请公布号 US2016172060(A1) 申请公布日期 2016.06.16
申请号 US201514968898 申请日期 2015.12.15
申请人 Samsung Electronics Co., Ltd. 发明人 KIM Kwang-Hyun
分类号 G11C29/56;G11C8/18;G11C7/22;G11C8/10 主分类号 G11C29/56
代理机构 代理人
主权项 1. A memory device comprising: first and second memory cell arrays; a first controller configured to control the first memory cell array through first word line signals and first bit line signals to execute an operation corresponding to a command signal based on an address signal and a data signal; and a second controller including first and second mode registers, the second controller configured to write sampled values of the address signal and the command signal to the second memory cell array through access signals to form a log, and to read stored values of the second memory cell array as the data signal through the access signals in response to stored values of the first and second mode registers, the stored values corresponding to at least one of address signals and command signals.
地址 Suwon-si KR