| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection device capable of inspecting a flaw defect occurring in a sheet continuously conveyed, with high accuracy. <P>SOLUTION: A flaw defect inspection device for a sheet comprises: light irradiation means for irradiating a linear light beam; light-receiving means for receiving part of the linear light beam; image processing means for detecting a flaw defect according to a signal received at the light-receiving means; and rotation means for rotating the light irradiation means and the light-receiving means simultaneously while keeping a state parallel to the sheet. Thus, a defect occurring in the continuously conveyed sheet can be detected with high accuracy. <P>COPYRIGHT: (C)2013,JPO&INPIT |
