Interferometer means for thickness measurements,申请号US19480000874-传众专利搜索

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发明名称	Interferometer means for thickness measurements
摘要
申请公布号	US2518647(A)	申请公布日期	1950.08.15
申请号	US19480000874	申请日期	1948.01.07
申请人	CELANESE CORPORATION OF AMERICA	发明人	TEEPLE JOHN H.;STRICKLER ABRAHAM
分类号	G01B9/02	主分类号	G01B9/02
代理机构		代理人
主权项
地址

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