| 摘要 |
Disclosed is a test handler. The test handler according to an embodiment of the present invention comprises: a loading device for loading an electronic component on a test tray; a test chamber including a tester which is in contact with the electronic component to test the electronic component; a pushing device for pushing the electronic component, which is loaded on the test tray, toward the tester; and an unloading device for unloading the electronic component, which has completed the test, from the test tray. The pushing device includes: a pressurizing plate for transmitting pressurizing force to the electronic component; a first rail horizontally extending from the center of the pressurizing plate; an upper match plate of which the lower end is in contact with the first rail; a lower match plate of which the upper end is in contact with the first rail; and a plurality of pushers provided on the upper match plate and the lower match plate to be in contact with the electronic component. The test handler of the present invention can smoothly test the electronic component even when the match plate is thermally deformed. |
